Calculates the fields within a multilayer stack illuminated from below by a plane wave using the analytic transfer matrix method. This function returns the E and H fields (Es, Ep, Hs, Hp). All results are returned in a single dataset as a function of frequency, incidence angle and location in the stack (z).
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Syntax |
Description |
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field = stackfield(n,d,f); |
Arguments for a stack with Nlayers: n: Refractive index of each layer. Size is either Nlayers, or Nlayers x length(f) if dispersive materials are involved. d: Thickness of each layer. Size is Nlayers. f: Frequency vector. |
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field = stackfield(n,d,f,theta,res); |
theta: Angle vector, in degrees. Optional, default is 0. res: resolution in the field result returned. Optional, default is 1000. |
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field = stackfield(n,d,f,theta,res,min,max); |
min/max: the min/max position where the user wishes to compute the field. 0 corresponds to the bottom of the stack. Optional, default is the span of the multilayer stack. |
Example
See stackrt.
See Also
List of commands , stackrt, getfdtdindex, visualize, stackdipole, STACK product reference manual